The diffusivity of H in crystalline material, deduced from profiling experiments involving nuclear resonance retention and secondary ion mass spectroscopy, was found to be 3 to 9 orders of magnitude smaller than the previously accepted value. Several facts which were often overlooked, when analyzing profiling measurements, were pointed out. A limited flux model was used to explain the observed results. The predictions of the model were supported by further experiments.

B.Y.Tong, X.W.Wu, G.R.Yang, S.K.Wong: Canadian Journal of Physics, 1989, 67[4], 379-83