The migration of Te was studied by using a radiotracer technique which involved 121Te which was produced and on-line implanted. Spreading resistance measurements were also made after diffusion from the vapor phase. Penetration profiles of Gaussian type and of erfc form were found, respectively, corresponding to the actual boundary conditions. The diffusion coefficients deduced from the two experiments exhibited excellent agreement. A pronounced curvature was observed in the Arrhenius diagram. Another striking feature was the occurrence of diffusion profiles which had an exponential dependence upon the penetration depth.

N.A.Stolwijk, F.Rollert, D.Grünebaum, H.Mehrer, G.Weyer: Materials Science Forum, 1986, 10-12, 133-8