Transmission electron microscopy revealed the presence of stacking faults on the cation sub-lattice of this chalcopyrite structure. The films had been grown by means of molecular beam epitaxy under Cu-rich conditions. The faults were found to extend over large distances in the plane of the film, and were not found in samples that had not been grown under Cu-rich conditions. It was suggested that these defects were nucleated by a Cu-induced transformation of the surface structure of the growing film.

O.Hellam, S.I.Tanaka, S.Niki, P.Fons: Journal of Materials Research, 1996, 11[6], 1398-402