Grain boundary Pb inclusions that had been formed by the ion implantation of bicrystalline Al films were investigated by means of transmission electron microscopy. The vapor-grown bicrystalline films contained mainly 90 <110> tilt boundaries of fixed misorientation but variable inclination. There were also growth twins with 70.5 <110> symmetrical tilt boundaries, and a few low-angle boundaries.

E.Johnson, A.Johansen, S.Hinderberger, S.Q.Xiao, U.Dahmen: Interface Science, 1996, 3[4], 279-88