Samples with a B2 ordered superlattice structure were studied by means of diffraction contrast transmission electron microscopy. Two types of stacking fault were observed by means of high-resolution transmission electron microscopy. In order to interpret the images, computer simulations were performed which were based upon various fault models. These simulations revealed that the stacking fault model that was deduced from diffraction contrast images, and which involved a displacement vector of a<100>/2, could not fit one type of high-resolution transmission electron microscopic image. A possible model for (1-3)a<100>/2 faults, and a mechanism for their production, was proposed.

Z.Y.Song, M.Hida, A.Sakakibara, Y.Takemoto: Materials Transactions, 1996, 37[2], 109-14