It was recalled that X-ray topographic and etching techniques had shown that some microstructure remained in secondary recrystallized grains of this steel. Transmission electron microscopy was used here to observe the microstructures, in grains with a {100}<001> orientation, immediately after secondary recrystallization. Stable alignments of dislocations were found in the recrystallized grains. The misorientations between sub-grains in the recrystallized grains were deduced from the dislocation densities, and these values were found to be comparable to those deduced from X-ray measurements. It was suggested that the dislocations were formed by grain boundary migration during secondary recrystallization, and could be classified into several types of dislocation geometry.

S.Suzuki, Y.Ushigami, Y.Suga, N.Takahashi: Materials Science Forum, 1996, 204-206, 575-80