It was noted that scanning transmission electron microscopy provided a means for the determination of interface structures and bonding. In particular, by using an annular detector, Z-contrast images were obtained which revealed the locations of atomic columns. The incoherent nature of these images permitted direct structure inversion via a maximum entropy analysis. By using such a combination of atomic-resolution imaging and spectroscopy, the structural units of [001] tilt grain boundaries in SrTiO3 were identified. All of the units revealed the presence of half-filled columns; which were considered to be an efficient means for overcoming the problem of like-ion repulsion in ionic materials. By using the 0.13nm probe of a 300kV scanning transmission electron microscope, an unexpected core structure was found for Lomer dislocations at a CdTe/GaAs [001] interface, while 60 dislocations were directly identified to be of glide type.

S.J.Pennycook, N.D.Browning, M.M.McGibbon, A.J.McGibbon, M.F.Chisholm, D.E.Jesson: Solid State Phenomena, 1996, 47-48, 561-72