Cu5Ca4Ba2HgO12: Point Defects

Polarized micro-Raman scattering measurements revealed a systematic evolution of the spectrum, which mainly involved O-related phonons at around 590, 570, 540 and 470/cm, that occurred with an increasing number of CuO2 layers. The use of local laser annealing measurements clearly demonstrated that all these phonons were closely related to interstitial O in HgOx planes. The evolution of the spectrum, as a function of the number of CuO2 layers, was attributed to the variation in interstitial O content.

X.Zhou, M.Cardona, C.W.Chu, Q.M.Lin, S.M.Loureiro, M.Marezio: Physical Review B, 1996, 54[9], 6137-40