The (111) cleavage faces of single crystals were etched to reveal crystallographically oriented triangular etch pits at the sites of dislocations. The activation energies and frequency factors for the lateral motion of ledges were calculated and were found to be higher in etchants with laevo tartaric acid than in those with dextro tartaric acid. The results were explained in terms of Sb complexes and the difference in the molecular shapes of the two forms of the acid.

A.H.Raval, M.J.Joshi, B.S.Shah: Crystal Research and Technology, 1995, 30[7], 1003-9