High-resolution transmission electron microscopy was used to study the detailed structure of antiphase boundaries in the tetragonal -phase of TiAl-based alloys. In agreement with earlier diffraction contrast images and micro-diffraction data, it was shown that, associated with each antiphase domain boundary that separated domains where the c-axes were parallel, there was a 2nm layer in which the c-axis was at right angles to the c-axes of the domains on either side.

T.T.Cheng, X.D.Zhang, Y.G.Li, M.J.Kaufman, I.P.Jones, M.H.Loretto: Philosophical Magazine Letters, 1996, 74[2], 51-6