Couples were investigated, at temperatures ranging from 423 to 523K, by using Auger depth profiling techniques. The samples consisted of 5mm x 5mm, 0.5mm-thick, 4N-purity Pd substrates and 260mm Ag films which were deposited onto the Pd substrates and annealed under ultra-high vacuum conditions. A method that was based upon Whipple’s Fourier-Laplace transform solution to the problem of coupled, grain boundary and intragranular, diffusion was used to deduce the interdiffusion coefficients and the activation energy for interdiffusion.

A.Bukaluk, M.Rozwadowski: Vacuum, 1995, 46[5-6], 579-82