Nanocrystalline samples were annealed during high-angle X-ray diffractometry in order to correlate changes in strain and defect content with changes in grain size. It was found that the magnitude of micro-strain broadening decreased rapidly before any grain growth, while the Debye-Waller parameter did not decrease appreciably before the onset of grain growth.

J.A.Eastman, M.A.Beno, C.S.Knapp, L.J.Thompson: Nanostructured Materials, 1995, 6[5-8], 543-6