A mean-field theory was developed for the drift and coalescence of voids in a thin passivated monocrystalline metal film through which passed an electrical current. Each circular void was assumed to drift down the local electric field at a speed which was inversely proportional to its radius. Current crowding was taken into account. This approach led to a mean-field equation of motion which was then integrated numerically. It was found that the number of voids of given area, per unit film area, obeyed a scaling relationship such that the mean void area grew linearly with time in the long-term regime.

H.Boularot, R.M.Bradley: Journal of Applied Physics, 1996, 80[2], 756-61