A synchrotron X-ray topographical analysis was made of the effect of distributions of defects upon the electrical behavior of diodes. Those which were fabricated on, or near to, liquid encapsulated Czochralski cellular dislocation networks in the substrate (which were also known to be rich in As precipitates near to the cell walls) exhibited a reduced breakdown voltage. This was consistent with the suggestion that the presence of space-charge cylinders around these dislocations gave rise to a reduced breakdown voltage if they threaded a p-n junction. It was also consistent with the possibility that the As precipitates themselves could act as sites for local field enhancement.

P.J.McNally, P.A.F.Herbert, T.Tuomi, M.Karilahti, J.A.Higgins: Journal of Applied Physics, 1996, 79[11], 8294-7