In order to determine the diffusion coefficient, CdTe/PbTe heterostructures were prepared by means of hot-wall epitaxy, and Cd concentration profiles were measured by means of Auger electron spectroscopy and sputtered neutral-mass spectroscopy. The depth profile data were used to evaluate the temperature dependence of the Cd diffusivity in heterostructures at between 350 and 450C. It was found that the results were close to those which were predicted by extrapolation from higher temperatures.

V.B.Bobruiko, T.A.Kouznetzova, M.P.Belyansky, A.M.Gaskov: Materials Science and Engineering B, 1995, 32[1-2], 7-10