Fluorite specimens which had been coated with a grounded thin Au layer were irradiated with 12keV electrons. The change in the halogen X-ray signal intensity was then measured as a function of time, for various incident doses. It was found that the experimental results could be fully explained by a simple model for anion migration that was driven by an electrostatic field. An Auger process was suggested for the initial escape of anions from their lattice sites. It was thought that this was the first time that the migration of halogen ions had been reported.

O.Jbara, J.Cazaux, G.Remond, C.Gilles: Journal of Applied Physics, 1996, 79[5], 2309-13