Lattice dislocations within the grains of an experimental internal boundary-layer capacitor were studied by using weak-beam transmission electron microscopy and conventional 2-beam imaging. The resultant images were compared with simulated images of various possible models for dislocations in perovskites. The lattice dislocations which were observed here were shown to be of mixed type and to have <110> Burgers vectors. They were dissociated, with co-linear splitting into 2 partial dislocations with ½<110> Burgers vectors. Evidence was found for the occurrence of both glide dissociation and climb dissociation. On the basis of the spacing of the partials, the stacking-fault energy in the doped material was estimated to be equal to 145mJ/m2 for glide dissociation and to 245mJ/m2 for climb dissociation.

Z.Mao, K.M.Knowles: Philosophical Magazine A, 1996, 73[3], 699-708