The deformation patterns at grain boundaries and at triple junctions in polycrystalline 5N-purity material were studied by means of electron back-scattering pattern observations. Specimens with 2 different grain sizes which had been rolled to reductions of 5 and 30% were examined by scanning across grain boundaries, along grain boundaries and by performing 2-dimensional scans near to triple junctions. These scans were carried out using small steps (1 to 5) over distances of up to 50. The electron back-scattering pattern measurements showed that the level of perturbation increased with strain, and that enhanced zones or perturbations were observed at grain boundaries; and especially so near to triple junctions. In the case of specimens which had been deformed by 30%, zones of large perturbation were observed at most of the grain boundaries. In the case of specimens which had been deformed by 5%, zones of large perturbation were found at some triple junctions.

V.Randle, N.Hansen, D.J.Jensen: Philosophical Magazine A, 1996, 73[2], 265-82