The reactivation kinetics of Li-passivated Zn and Cu acceptors were studied by means of the thermal annealing of reverse-biased Schottky diodes. It was shown that the activation of passivated Zn acceptors could be related to thermal dissociation of the Li-Zn complex; with a corresponding dissociation energy of 0.85eV. On the other hand, the activation of passivated Cu acceptors occurred in 2 stages which were associated with distinct reactivation frequencies, and with thermal activation energies of 1.11 and 1.30eV. Both energies were tentatively attributed to the dissociation of Li-Cu related complexes.

K.Leosson, B.H.Yang, H.P.Gislason: Materials Science Forum, 1995, 196-201, 1395-400