The -fringe contrast which was exhibited by micro-twins of various thickness in (001)-oriented Cd0.95Zn0.04Te was characterized for both strong-beam and weak-beam conditions. It was demonstrated that the contrast behavior permitted the form of the twin to be determined as a function of its thickness. If N was the number of (111) planes in the twin, then the 3 distinct classes of contrast behavior which were exhibited were associated with the twin being intrinsic (N = 3n-1), extrinsic (N = 3n-1) or perfect (N = 3n). It was shown that care was required in order to distinguish intrinsic and extrinsic faults from their twin counterparts. Examples of twins that might have been mistaken for faults, in the absence of a full characterization of their contrast, were observed in a crept /’ alloy. It was noted that the presence of such defects was of relevance to the modelling of the growth of compound semiconductors and to the modelling of creep mechanisms. The implications of the similarity of micro-twin and fault contrast were also considered with regard to the literature on the so-called anomalous weak-beam contrast of stacking faults.

C.Y.Chen, W.M.Stobbs: Ultramicroscopy, 1995, 58[3-4], 289-305