Growth defects in flux-grown crystals were investigated by means of white-beam synchrotron radiation topography. It was found that growth-sector boundaries were the main growth defects, and exhibited a marked X-ray kinematic contrast in topographs. All of the dislocations were growth-induced and appeared only in the near-cap region. The area away from the capped region was almost dislocation-free. The growth bands exhibited a weak contrast in X-ray topography. This implied that the impurity contents were relatively low in the various growth sectors, and that each growth sector was uniform in composition.

Growth Defects in Flux Grown RbTiOAsO4 Crystals Observed with White-Beam Synchrotron Radiation Topography. X.B.Hu, J.Y.Wang, W.H.Cui, Q.C.Guan, R.B.Song, J.Q.Wei, Y.G.Liu, J.H.Jiang, Y.L.Tian: Journal of Crystal Growth, 1999, 205[3], 323-7