Photoluminescence and electroluminescence measurements revealed 2 de-excitation processes for Er light emission. A non-radiative energy back-transfer of the excited Er3+, due to an Auger impurity process, was demonstrated. In order to predict the emission intensity after implantation annealing, a process simulator was constructed. This took account of ligand out-diffusion and of Er-ligand complex formation and dissociation.

J.Michel, J.Palm, F.Gan, F.Y.G.Ren, B.Zheng, S.T.Dunham, L.C.Kimerling: Materials Science Forum, 1995, 196-201, 585-90