A high-resolution Laplace-transform deep-level transient spectroscopic technique was used to study the fine structure in the carrier emission process for transition metal- and thermal donor-related defects. In the case of the transition metal centers, the method revealed the fine structure when the defect had emission characteristics which were similar to those of other defects. The method also demonstrated the complex emission of thermal donors. In the case of an Fe-B pair in p-type material, a magnetic field effect upon the emission process was demonstrated.

L.Dobaczewski, P.Kaminski, R.Kozlowski, M.Surma: Materials Science Forum, 1995, 196-201, 669-76