By using X-ray diffractometry, Lang topography and selective etching methods, it was shown that the crystal perfection of MCZ monocrystals depended strongly upon the growth conditions. By performing a Debye-Waller static factor change analysis, recalling that the latter factor described the total lattice distortion (total effect of all micro-defects and root mean square atom displacements), it was shown that the structure and homogeneity of ingots which had been grown by using the Czochralski technique under an applied constant axial magnetic field were improved by increasing the field strength.

T.M.Tkacheva, G.N.Petrov, L.I.Datsenko: Materials Science Forum, 1995, 196-201, 1719-24