Field-ion microscopy was used to study the atomic-level structure of antiphase boundaries. This technique permitted a metallic sample volume to be investigated by using the controlled evaporation of atomic layers. An emitter shape was used from which the antiphase boundaries could be reconstructed in 3 dimensions. The approach to the exact spatial arrangement of boundaries in the material volume permitted the nature of planes of antiphase boundaries to be determined. The results supported those of high-resolution electron microscopy, which showed that the antiphase boundaries were located mainly in the (001) cubic planes.

S.Duval, S.Chambreland, D.Blavette, A.Loiseau, L.Potez: Applied Surface Science, 1995, 87-88, 284-90