A theory which described diffraction effects from stacking faults in close-packed polytypic crystal structures was applied to the measurement of these diffraction effects for cases where needle-shaped or rod-like specimens could not be prepared from samples such as thin films, or when single crystals could not be destroyed in order to prepare such specimens. For these cases, measurement methods were developed which were based upon the use of standard X-ray diffraction equipment such as oscillation or Weissenberg cameras and powder diffractometers. A complete description of the limits of the area of the reciprocal lattice which could intersect the Ewald sphere was provided. The diffractometer 2-dimensional scanning method, which permitted an undistorted reciprocal lattice to be recorded, also permitted greater precision, and gave results that were more convenient for mathematical treatment than were photographic methods, was suggested to be especially interesting.

E.Michalski, W.Piecek, M.Demianiuk: Acta Crystallographica, 1995, A51[4], 548-58