On the basis of a detailed analysis of polarized Raman and luminescence data from a so-called mosaic film, the symmetry properties of an ubiquitous point defect in such films were deduced. This defect, which gave rise to an emission at 738nm, was deduced to be a <110>-oriented defect, with the transition dipole moment of the center oriented along the <110> symmetry axis. This was the first analysis of the symmetry properties of this point defect.

S.W.Brown, S.C.Rand: Journal of Applied Physics, 1995, 78[6], 4069-75