Micro-defects in Te-doped single crystals were studied by using triple-crystal diffractometry and X-ray diffuse scattering techniques. The diffuse scattering intensity distribution along the diffraction vector indicated the presence of micro-defects with both positive and negative dilatation. The ratio of the numbers of micro-defects with differing dilatation signs depended upon the doping level. With increasing Te concentration, the size of large vacancy-type micro-defects decreased, and the concentration of small micro-defects decreased as the pseudo-binary section was approached, and then increased again.

V.T.Bublik, K.D.Shcherbachev: Kristallografiya, 1995, 40[1], 122-7 (Crystallography Reports, 1995, 40[1], 110-5)