A new arrangement of piled-up dislocations (a so-called dislocation wall) was observed for the first time, using light-scattering tomography, on some {111} planes in crystals which had been grown by using a vapor phase method. The walls were flat platelets (about 10 to 15 in thickness) at which many dislocations were randomly and abnormally piled up. Other characteristics of the dislocation walls were studied by using molten KOH etching, and the cathode-ray luminescence mode of scanning electron microscopy. Many other dislocation lines were also clearly observed outside of the walls.

M.Ma, T.Ogawa: Philosophical Magazine A, 1995, 72[1], 113-20