Transmission electron microscopy was used to characterize the microstructure of samples which had been prepared by ion-beam thinning. It was found that porosity was largely associated with grain boundaries. The main sub-structural feature was a regular array of low-angle boundaries with an average misorientation of 0.5. Many of the high-angle boundaries exhibited periodic arrays of dislocations.

K.B.Shim, J.Kwiencinski, M.J.Edirisinghe, B.Ralph: Materials Science Forum, 1995, 189-190, 129-34