Nanocrystalline samples that had been prepared by means of the crystallization of amorphous material were studied by using the positron annihilation technique. Positron lifetime and line-shape parameters were obtained as a function of the annealing temperature. The results showed that 2 types of defect existed at the interfaces of the nanocrystalline alloy. These were vacancy-like and vacancy-like group micro-voids. The former were present in the overwhelming majority.

T.Liu, Z.T.Zhao, Z.X.Xu, R.Z.Ma, Y.H.Guo, H.M.Cao, Y.Y.Wang: Journal of Applied Physics, 1995, 77[12], 6214-6