The evolution of interfacial dislocations during the early stages of the creep of single crystals was studied. On interfaces which were oriented perpendicular to the load axis, 60 dislocations with extra half-planes in the ’ phase were observed by means of transmission electron microscopy. In the case of matrix channels which were oriented parallel to the load axis, the interfaces contained only screw dislocations. The results suggested that coherency stresses governed the evolution of the microstructure up to the secondary creep stage.

M.Feller-Kniepmeier, U.Hemmersmeier, T.Kuttner, T.Link: Scripta Metallurgica et Materialia, 1994, 30[10], 1275-80