Auger electron spectroscopic composition depth profiling and Rutherford back-scattering spectrometry were used to study thermal interdiffusion between thin Pt and Cr films which had been vapor-deposited onto Fe substrates. Annealing at 400C in high vacuum for 1h did not lead to the appearance of any detectable alloying or intermetallic phases. Upon annealing at 500C in high vacuum for 1h, Pt3Cr was observed. Upon annealing at 600C in high vacuum for 1h, phases (PtCr, Cr2Pt) were observed which were not indicated on the phase diagram.

C.J.Terblanche, J.P.Roux, P.E.Viljoen, H.C.Swart: Applied Surface Science, 1994, 74, 303-13