Results in 1+1 and 2+1 dimensions were presented for the surface diffusion-controlled profile relaxation in the solid-on-solid model, above and below the roughening transition. In all cases, it was found that the characteristic time-scale for the decay of a sinusoidal profile scaled approximately with the fourth power of the wavelength. The results were explained in terms of the anomalous diffusion of tracer atoms whose root mean-square displacement scaled as the ¼ power of time.

P.C.Searson, R.Li, K.Sieradzki: Physical Review Letters, 1995, 74[8], 1395-8