A study was made of the morphological changes which occurred in an interface that was subjected to a strong electric field which was normal to the initially planar interface. Electromigration along the interface in a 2-phase metallic system with immiscible components was considered. The stresses which arose during electromigration of the components were taken into account. A non-linear equation was derived, for interfacial changes in the electric field, which allowed for the curvature of the interface. It was shown that interface diffusion in an electric field led to the formation of a periodic corrugation at the interface when the components were distinguished by their electric charges. The corrugation increased with time, and transformed into a channel/hillock structure.

L.Klinger, L.Levin: Journal of Applied Physics, 1995, 78[3], 1669-72