This method was developed in order to calculate the statistical distribution function of dislocation cell sizes on the basis of X-ray diffraction-broadened profile data. By using this method, the statistical distribution function and the maximum, minimum and mean sizes of dislocation cells could be deduced without making any assumption concerning the form of the measured profiles. The principles and procedures of the method were presented here, and a simulated example was provided. The minimum, maximum and mean dislocation cell sizes were found to decrease with increasing width of the X-ray diffraction-broadened profiles. The so-called hook effect in the Warren-Averbach method could be avoided by using the concept of a minimum dislocation cell size.

M.J.Cai, W.B.Lee, F.Y.Sun: Acta Metallurgica et Materialia, 1995, 43[2], 529-33