Systematic X-ray diffraction defect characterization was carried out on crystalline material which contained 2, 4, 6, 8, or 10mol% of Cd2+. Quantitative estimates of the number and nature of the defects were deduced from integrated X-ray intensity measurements. Further analyses of the experimental data indicated an enhancement of the Debye-Waller factor with increasing concentration of Cd2+. Density and unit cell measurements at room temperature yielded the vacancy contents.

R.Saravanan, S.K.Mohanlal: Crystal Research and Technology, 1995, 30[1], 55-62