The thin-film X-ray diffraction technique was used in conjunction with computer simulation methods in order to obtain detailed information on the structure of complex interfacial systems in metals. Results were presented for a  = 13 [001] twist homophase boundary in a Au-10at%Cu alloy, a  = 26/29 [001] twist Au/Pd heterophase boundary and a  = 4/5 [001] twist Ag/Cu heterophase boundary. In the case of the Au/Cu homophase boundary, the utility of the X-ray technique for studying the effects of solute segregation upon boundary structure was demonstrated. The calculations predicted trends which were in agreement with experimental observations. On the other hand, the exact magnitudes of the observed effects were not reproduced by the calculations. In the case of the Au/Pd heterophase boundary, semi-quantitative agreement was obtained between experimental data and calculations which were performed using embedded atom method potentials and molecular statics. In the case of the Ag/Cu  = 4/5 system, a strong X-ray scattering was correlated with surprisingly large atomic displacements in the boundary, and fairly good agreement was obtained with computer-simulated structures.

I.Majid, C.A.Counterman, R.Najafabadi, P.D.Bristowe: Journal of the Physics and Chemistry of Solids, 1994, 55[10], 1007-15