The emission of dislocations from a crack which propagated at the ductile-brittle transition temperature was observed via the combined use of focussed ion beam techniques and transmission electron microscopy. Many dislocation lines and dislocation loops were observed in the wake of a ductile-brittle transition temperature crack, while no dislocations were observed in the wake of a pre-crack which was introduced at room temperature. Moreover, those glide dislocation lines which were emitted by the ductile-brittle transition temperature crack were smoothly curved; thus indicating that they could easily overcome the Peierls stress.

TEM Observation of Dislocation Emission from a Crack at DBTT in Si. Suprijadi, H.Saka: Materials Transactions, 2001, 42[1], 28-32