The method of so-called integral diffuse scattering was generalized to the Bragg case of X-ray diffraction by crystals which contained micro-defects that were commensurable with the extinction length. Relatively simple analytical expressions were derived for the coherent and diffuse components of the reflectivity of single crystals which contained randomly distributed micro-defects. Rocking curves of Czochralski-grown annealed (1080C, 6h) single crystals, which contained dislocation loops and O precipitates, were measured by using a high-resolution double-crystal X-ray diffractometer.

Double-Crystal X-Ray Diffractometry of Single Crystals with Microdefects. V.B.Molodkin, S.I.Olikhovskii, E.N.Kislovskii, V.P.Krivitsky, E.G.Len, E.V.Pervak, G.E.Ice, B.C.Larson: Journal of Physics D, 2001, 34[SA], 82-6