High-energy electron diffraction was used to obtain reduced density functions from multilayered thin films. Only interatomic correlations which were perpendicular to the incoming electron beam were responsible for the scattered intensity. This permitted an investigation to be made of the interface interdiffusion of inner surfaces. As no specimen preparation was required, the technique was unaffected by artefacts of preparation.

Derivation of Pair Distribution Functions for Interface Interdiffusion Analysis for Multilayered Thin Films using High-Energy Electron Diffraction. W.Brunner, W.Attenberger, H.Hoffmann, J.Zweck: Journal of Physics - Condensed Matter, 2001, 13[13], 2865-73