The approaches used to analyse X-ray or neutron scattering by crystals with various dislocation ensembles were compared. The microscopic approach took account of the detailed displacement fields due to the types of dislocation arrangement in the crystal. The phenomenological concept, based upon the displacements, strains and stresses which arose in deforming materials, could not take account of the fact that similar stress distributions might have significantly different microscopic causes. A comparison of the results which were obtained using the phenomenological and microscopic descriptions of scattering permitted an understanding of the connection between different types of strains and stresses, as a function of defect type.

Phenomenological and Microscopic Description of Scattering on Different Dislocation Arrangements. R.Barabash, P.Klimanek: Zeitschrift für Metallkunde, 2001, 92[1], 70-5