Ultra-small angle X-ray scattering by dislocations in single crystals was observed in situ as a function of plastic deformation. The scattering was strongly dependent upon sample orientation, with single dislocations, dislocation dipoles, and the dislocation distribution within walls each exhibiting distinct scattering profiles. Among the microstructural features that had been observed were correlations between the ordered fraction of dislocations, the presence of dislocation dipoles, the increasing dislocation content with increasing strain, and the decreasing width of the interface between dislocation walls and almost dislocation-free surrounding material.

In situ Observations of Small-Angle X-Ray Scattering by Dislocations. G.G.Long, L.E.Levine, R.Thomson: Journal of Applied Crystallography, 2000, 33[3], 456-60