Rutherford back-scattering and channelling measurements were used to study deep radiation damage, and to depth-profile implanted Au atoms in pure Cu and Cu-1at%Ni single crystals which had been irradiated with 300keV Au+ off-axis ions at room temperature to a dose of 2 x 1016/cm2. The damage and depth ranges of the implanted Au atoms in specimens of pure Cu were markedly deeper than those in the Cu-Ni alloy. This was attributed to the effect of an atomic migration mechanism in solids under ion beam irradiation.

Ion-beam Irradiation of Cu and Cu-Ni Alloy Single-Crystal Specimens - Proposed Atom Movement Mechanism. Y.Fujino, Y.Igarashi, S.Nagata: Physical Review B, 2001, 63[10], 100101 (4pp)