A review was presented of experimental data on the stress effect upon grain-boundary diffusion, in the B- and C-regimes, in thin polycrystalline films. Numerical solutions were obtained for the conditions of a reflecting free-surface and for rapid surface diffusion on the sink surface; for the case of a constant source.

Grain Boundary Diffusion in Thin Films under Stress Fields. A.S.Ostrovsky, B.S.Bokstein: Applied Surface Science, 2001, 175-176, 312-8