A mechanism was proposed for misfit dislocation generation at the interface of a hollow solid nanotube (film) and an infinite solid matrix (substrate). The film and substrate were assumed to be isotropic and to have the same sets of elastic moduli. It was found that misfit dislocation generation was favourable within a certain range of misfit values, cavity radii and film thicknesses. It was noted that, for a given misfit and cavity radius, there was a critical film thickness. The magnitude of the latter, for the present system, was greater than that for a plate-like film/substrate composite having the same misfit. The critical thickness increased with decreasing cavity radius. Unlike the case of hollow nanotubes, misfit dislocations in solid nanowires embedded in an infinite medium were not favoured for any misfit or wire radius. The present work predicted the critical pore radius below which misfit dislocations could not nucleate in porous composites.

Misfit Dislocations in a Hollow Cylindrical Film Grown on a Hole Surface. A.G.Sheinerman, M.Y.Gutkin: Scripta Materialia, 2001, 45[1], 81-7