It was recalled that 2 approaches were used to analyze X-ray or neutron scattering by crystals with various dislocation arrangements. The analogy between these methods was considered. The microscopic approach took account of the detailed displacement fields due to various types of dislocation arrangement in the crystal. The phenomenological concept involved the displacements, strains and stresses which arose in materials under deformation. Unfortunately, the phenomenological concept could not take account of the fact that similar stress distributions could have very different microscopic causes. A comparison of the results which were obtained by using both the phenomenological and microscopic descriptions of scattering permitted a understanding of the connection between various types of strain and stress in a crystal with a given type of defect in it.

Phenomenological and Microscopic Description of Scattering on Different Dislocation Arrangements. R.Barabash: Zeitschrift für Metallkunde, 2001, 92[1], 70-5