A direct formalism was derived for the solution of diffraction patterns from a faulted layer crystal. The proposed method was not limited to a given crystal structure, it avoided the need for a specific planar fault model and had a direct physical meaning. The correlation distribution function between laterally displaced layers could be directly obtained from the diffracted intensities. The solution gave satisfactory agreement with a Monte Carlo trial-and-error method for the face-centered cubic structure. The present formalism was used to determine the layer-layer correlation distribution function of the Co17Gd2 faulted-layer structure.

Direct Solution of the Diffraction Pattern of a Crystal with Planar Faulting. E.Estevez-Rams, J.Martinez, A.Penton-Madrigal, R.Lora-Serrano: Physical Review B, 2001, 63[5], 054109 (10pp)