The temperature dependence of the parameter, ω, for Ag grain-boundary diffusion was deduced from Ag and Cu Auger signals which were measured on the surface of nanocrystalline thin Cu/Ag bilayers. Here, ω was equal to δkbDb/δsksDs, with δ and δs being the width of the grain boundary and the segregated layer and kb and ks the grain-boundary and surface segregation factors, respectively. The latter were determined by using the Hwang–Balluffi method, in the C-kinetics regime, at temperatures ranging from 393 to 428K. These values were compared with triple products which had been determined at 584 to 804K, by using radiotracer technique in the B-kinetics regime, and yielded the temperature dependence of the surface segregation factor. The surface segregation energy (34kJ/mol) agreed well with other published data.

Determination of Grain-Boundary Diffusion of Ag in Nanocrystalline Cu by the Hwang–Balluffi Method. Z.Erdélyi, C.Girardeaux, G.A.Langer, D.L.Beke, A.Rolland, J.Bernardini: Journal of Applied Physics, 2001, 89[7], 3971-5