Bicrystals having a twist nature were grown by using the vertical Bridgman technique. They were grown so that the grain boundary in each sample had a nominal twist misorientation which consisted of either a low angle (10º), a special angle (Σ = 36.87º) or a high angle (45º). The grain boundary plane in all cases was (100). The grain boundaries were grown by using monocrystalline seeds that were oriented to within 0.5º by using the Laue back-reflection X-ray diffraction method. All of the grain boundary orientations were determined to be within the limit defined by the Brandon criterion.

Bicrystal Growth and Characterization of Copper Twist Grain Boundaries. S.M.Schwarz, E.C.Houge, L.A.Giannuzzi, A.H.King: Journal of Crystal Growth, 2001, 222[1-2], 392-8